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Basics of X-ray DiffractionH. Stanjek Institut für Mineralogie und Lagerstättenlehre, Rheinisch Westfälische Technische Hochschule, 52056 Aachen, Germany W. Häusler Physik-Department E15, Technische Universität München, 85747 Garching, Germany Abstract X-ray diffraction (XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite-containing pottery sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite content of such samples could be determined. Keywords X-ray diffraction, Rietveld simulation, graphite, graphite clays, black pottery
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